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EUV Technology manufactures custom R&D instrumentation for the utilization and analysis of short wavelength electromagnetic radiation –
soft x-rays and extreme ultraviolet (EUV). We specialize in metrology and calibration tools for EUV lithography.

Through our SuMMIT Software Division we also develop and market SEM analysis software for the lithography community.

Extreme Ultraviolet Lithography (EUVL)

Extreme Ultraviolet Lithography (EUVL) will open a new chapter in semiconductor technology. In the race to provide the Next Generation Lithography (NGL) for faster, more efficient computer chips, EUV Lithography is the clear frontrunner. At EUV Technology, we're committed to providing the highest quality EUV Metrology and EUV Calibration tools available anywhere. Highest quality and reliability, user-friendly software and hardware, and very competitive prices: these are the pillars upon which our business is built.

If your work involves soft x-ray technology (SXR), VUV technology, or any cutting-edge lithography designs, we think you'll find our products worth examining. Please feel free to communicate with us if you have any special requirements for your EUV application.


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Last Updated: September 01st, 2005
Copyright 2005 EUV Technology